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Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications
Bragg diffraction imaging enables the quality of synthetic single-crystal diamond substrates and their overgrown, mostly doped, diamond layers to be characterized. This is very important for improving diamond-based devices produced for X-ray optics and power electronics applications. The usual first...
Autores principales: | , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377351/ https://www.ncbi.nlm.nih.gov/pubmed/28381981 http://dx.doi.org/10.1107/S1600576717003831 |
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author | Tran Thi, Thu Nhi Morse, J. Caliste, D. Fernandez, B. Eon, D. Härtwig, J. Barbay, C. Mer-Calfati, C. Tranchant, N. Arnault, J. C. Lafford, T. A. Baruchel, J. |
author_facet | Tran Thi, Thu Nhi Morse, J. Caliste, D. Fernandez, B. Eon, D. Härtwig, J. Barbay, C. Mer-Calfati, C. Tranchant, N. Arnault, J. C. Lafford, T. A. Baruchel, J. |
author_sort | Tran Thi, Thu Nhi |
collection | PubMed |
description | Bragg diffraction imaging enables the quality of synthetic single-crystal diamond substrates and their overgrown, mostly doped, diamond layers to be characterized. This is very important for improving diamond-based devices produced for X-ray optics and power electronics applications. The usual first step for this characterization is white-beam X-ray diffraction topography, which is a simple and fast method to identify the extended defects (dislocations, growth sectors, boundaries, stacking faults, overall curvature etc.) within the crystal. This allows easy and quick comparison of the crystal quality of diamond plates available from various commercial suppliers. When needed, rocking curve imaging (RCI) is also employed, which is the quantitative counterpart of monochromatic Bragg diffraction imaging. RCI enables the local determination of both the effective misorientation, which results from lattice parameter variation and the local lattice tilt, and the local Bragg position. Maps derived from these parameters are used to measure the magnitude of the distortions associated with polishing damage and the depth of this damage within the volume of the crystal. For overgrown layers, these maps also reveal the distortion induced by the incorporation of impurities such as boron, or the lattice parameter variations associated with the presence of growth-incorporated nitrogen. These techniques are described, and their capabilities for studying the quality of diamond substrates and overgrown layers, and the surface damage caused by mechanical polishing, are illustrated by examples. |
format | Online Article Text |
id | pubmed-5377351 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-53773512017-04-05 Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications Tran Thi, Thu Nhi Morse, J. Caliste, D. Fernandez, B. Eon, D. Härtwig, J. Barbay, C. Mer-Calfati, C. Tranchant, N. Arnault, J. C. Lafford, T. A. Baruchel, J. J Appl Crystallogr Research Papers Bragg diffraction imaging enables the quality of synthetic single-crystal diamond substrates and their overgrown, mostly doped, diamond layers to be characterized. This is very important for improving diamond-based devices produced for X-ray optics and power electronics applications. The usual first step for this characterization is white-beam X-ray diffraction topography, which is a simple and fast method to identify the extended defects (dislocations, growth sectors, boundaries, stacking faults, overall curvature etc.) within the crystal. This allows easy and quick comparison of the crystal quality of diamond plates available from various commercial suppliers. When needed, rocking curve imaging (RCI) is also employed, which is the quantitative counterpart of monochromatic Bragg diffraction imaging. RCI enables the local determination of both the effective misorientation, which results from lattice parameter variation and the local lattice tilt, and the local Bragg position. Maps derived from these parameters are used to measure the magnitude of the distortions associated with polishing damage and the depth of this damage within the volume of the crystal. For overgrown layers, these maps also reveal the distortion induced by the incorporation of impurities such as boron, or the lattice parameter variations associated with the presence of growth-incorporated nitrogen. These techniques are described, and their capabilities for studying the quality of diamond substrates and overgrown layers, and the surface damage caused by mechanical polishing, are illustrated by examples. International Union of Crystallography 2017-03-29 /pmc/articles/PMC5377351/ /pubmed/28381981 http://dx.doi.org/10.1107/S1600576717003831 Text en © Thu Nhi Tran Thi et al. 2017 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/2.0/uk/ |
spellingShingle | Research Papers Tran Thi, Thu Nhi Morse, J. Caliste, D. Fernandez, B. Eon, D. Härtwig, J. Barbay, C. Mer-Calfati, C. Tranchant, N. Arnault, J. C. Lafford, T. A. Baruchel, J. Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications |
title | Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications
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title_full | Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications
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title_fullStr | Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications
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title_full_unstemmed | Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications
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title_short | Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications
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title_sort | synchrotron bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377351/ https://www.ncbi.nlm.nih.gov/pubmed/28381981 http://dx.doi.org/10.1107/S1600576717003831 |
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