Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications

Bragg diffraction imaging enables the quality of synthetic single-crystal diamond substrates and their overgrown, mostly doped, diamond layers to be characterized. This is very important for improving diamond-based devices produced for X-ray optics and power electronics applications. The usual first...

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Detalles Bibliográficos
Autores principales: Tran Thi, Thu Nhi, Morse, J., Caliste, D., Fernandez, B., Eon, D., Härtwig, J., Barbay, C., Mer-Calfati, C., Tranchant, N., Arnault, J. C., Lafford, T. A., Baruchel, J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5377351/
https://www.ncbi.nlm.nih.gov/pubmed/28381981
http://dx.doi.org/10.1107/S1600576717003831

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