3D lattice distortions and defect structures in ion-implanted nano-crystals

Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga(+)), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale revolutionised sample preparation across...

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Detalles Bibliográficos
Autores principales: Hofmann, Felix, Tarleton, Edmund, Harder, Ross J., Phillips, Nicholas W., Ma, Pui-Wai, Clark, Jesse N., Robinson, Ian K., Abbey, Brian, Liu, Wenjun, Beck, Christian E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5382701/
https://www.ncbi.nlm.nih.gov/pubmed/28383028
http://dx.doi.org/10.1038/srep45993

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5382701/
https://www.ncbi.nlm.nih.gov/pubmed/28383028
http://dx.doi.org/10.1038/srep45993

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