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3D lattice distortions and defect structures in ion-implanted nano-crystals
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga(+)), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale revolutionised sample preparation across...
Autores principales: | Hofmann, Felix, Tarleton, Edmund, Harder, Ross J., Phillips, Nicholas W., Ma, Pui-Wai, Clark, Jesse N., Robinson, Ian K., Abbey, Brian, Liu, Wenjun, Beck, Christian E. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5382701/ https://www.ncbi.nlm.nih.gov/pubmed/28383028 http://dx.doi.org/10.1038/srep45993 |
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