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Tunable Wetting Property in Growth Mode-Controlled WS(2) Thin Films
We report on a thickness-dependent wetting property of WS(2)/Al(2)O(3) and WS(2)/SiO(2)/Si structures. We prepared WS(2) films with gradient thickness by annealing thickness-controlled WO(3) films at 800 °C in sulfur atmosphere. Raman spectroscopy measurements showed step-like variation in the thick...
Autores principales: | Choi, Byoung Ki, Lee, In Hak, Kim, Jiho, Chang, Young Jun |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5383915/ https://www.ncbi.nlm.nih.gov/pubmed/28395480 http://dx.doi.org/10.1186/s11671-017-2030-z |
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