50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors

X-ray spectromicroscopy with a full-field imaging technique is a powerful method for chemical analysis of heterogeneous complex materials with a nano-scale spatial resolution. For imaging optics, an X-ray reflective optical system has excellent capabilities with highly efficient, achromatic, and lon...

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Detalles Bibliográficos
Autores principales: Matsuyama, Satoshi, Yasuda, Shuhei, Yamada, Jumpei, Okada, Hiromi, Kohmura, Yoshiki, Yabashi, Makina, Ishikawa, Tetsuya, Yamauchi, Kazuto
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5390314/
https://www.ncbi.nlm.nih.gov/pubmed/28406227
http://dx.doi.org/10.1038/srep46358

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5390314/
https://www.ncbi.nlm.nih.gov/pubmed/28406227
http://dx.doi.org/10.1038/srep46358

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