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50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors
X-ray spectromicroscopy with a full-field imaging technique is a powerful method for chemical analysis of heterogeneous complex materials with a nano-scale spatial resolution. For imaging optics, an X-ray reflective optical system has excellent capabilities with highly efficient, achromatic, and lon...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5390314/ https://www.ncbi.nlm.nih.gov/pubmed/28406227 http://dx.doi.org/10.1038/srep46358 |