Elucidation of crystal and electronic structures within highly strained BiFeO(3) by transmission electron microscopy and first-principles simulation

Crystal and electronic structures of ~380 nm BiFeO(3) film grown on LaAlO(3) substrate are comprehensively studied using advanced transmission electron microscopy (TEM) technique combined with first-principles theory. Cross-sectional TEM images reveal the BiFeO(3) film consists of two zones with dif...

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Detalles Bibliográficos
Autores principales: Bae, In-Tae, Kovács, András, Zhao, Hong Jian, Íñiguez, Jorge, Yasui, Shintaro, Ichinose, Tomohiro, Naganuma, Hiroshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5395957/
https://www.ncbi.nlm.nih.gov/pubmed/28422150
http://dx.doi.org/10.1038/srep46498

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5395957/
https://www.ncbi.nlm.nih.gov/pubmed/28422150
http://dx.doi.org/10.1038/srep46498

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