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Elucidation of crystal and electronic structures within highly strained BiFeO(3) by transmission electron microscopy and first-principles simulation

Crystal and electronic structures of ~380 nm BiFeO(3) film grown on LaAlO(3) substrate are comprehensively studied using advanced transmission electron microscopy (TEM) technique combined with first-principles theory. Cross-sectional TEM images reveal the BiFeO(3) film consists of two zones with dif...

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Detalles Bibliográficos
Autores principales: Bae, In-Tae, Kovács, András, Zhao, Hong Jian, Íñiguez, Jorge, Yasui, Shintaro, Ichinose, Tomohiro, Naganuma, Hiroshi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5395957/
https://www.ncbi.nlm.nih.gov/pubmed/28422150
http://dx.doi.org/10.1038/srep46498
Descripción
Sumario:Crystal and electronic structures of ~380 nm BiFeO(3) film grown on LaAlO(3) substrate are comprehensively studied using advanced transmission electron microscopy (TEM) technique combined with first-principles theory. Cross-sectional TEM images reveal the BiFeO(3) film consists of two zones with different crystal structures. While zone II turns out to have rhombohedral BiFeO(3), the crystal structure of zone I matches none of BiFeO(3) phases reported experimentally or predicted theoretically. Detailed electron diffraction analysis combined with first-principles calculation allows us to determine that zone I displays an orthorhombic-like monoclinic structure with space group of Cm (=8). The growth mechanism and electronic structure in zone I are further discussed in comparison with those of zone II. This study is the first to provide an experimentally validated complete crystallographic detail of a highly strained BiFeO(3) that includes the lattice parameter as well as the basis atom locations in the unit cell.