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A fast image simulation algorithm for scanning transmission electron microscopy

Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorit...

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Detalles Bibliográficos
Autor principal: Ophus, Colin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5423922/
https://www.ncbi.nlm.nih.gov/pubmed/28546904
http://dx.doi.org/10.1186/s40679-017-0046-1