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A fast image simulation algorithm for scanning transmission electron microscopy
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorit...
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Formato: | Online Artículo Texto |
Lenguaje: | English |
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Springer International Publishing
2017
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5423922/ https://www.ncbi.nlm.nih.gov/pubmed/28546904 http://dx.doi.org/10.1186/s40679-017-0046-1 |