Cargando…
A fast image simulation algorithm for scanning transmission electron microscopy
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorit...
Autor principal: | Ophus, Colin |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer International Publishing
2017
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5423922/ https://www.ncbi.nlm.nih.gov/pubmed/28546904 http://dx.doi.org/10.1186/s40679-017-0046-1 |
Ejemplares similares
-
A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy
por: Pryor, Alan, et al.
Publicado: (2017) -
Multi-pass transmission electron microscopy
por: Juffmann, Thomas, et al.
Publicado: (2017) -
Nanomaterial datasets to advance tomography in scanning transmission electron microscopy
por: Levin, Barnaby D.A., et al.
Publicado: (2016) -
Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
por: Ophus, Colin, et al.
Publicado: (2016) -
Atomic electrostatic maps of 1D channels in 2D semiconductors using 4D scanning transmission electron microscopy
por: Fang, Shiang, et al.
Publicado: (2019)