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In situ MEMS testing: correlation of high-resolution X-ray diffraction with mechanical experiments and finite element analysis
New methods are needed in microsystems technology for evaluating microelectromechanical systems (MEMS) because of their reduced size. The assessment and characterization of mechanical and structural relations of MEMS are essential to assure the long-term functioning of devices, and have a significan...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Taylor & Francis
2017
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5425911/ https://www.ncbi.nlm.nih.gov/pubmed/28533825 http://dx.doi.org/10.1080/14686996.2017.1282800 |