Voltage-induced Interface Reconstruction and Electrical Instability of the Ferromagnet-Semiconductor Device

Using x-ray magnetic spectroscopy with in-situ electrical characterizations, we investigated the effects of external voltage on the spin-electronic and transport properties at the interface of a Fe/ZnO device. Layer-, element-, and spin-resolved information of the device was obtained by cross-tuning...

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Detalles Bibliográficos
Autores principales: Chang, Shu-Jui, Chang, Po-Chun, Lin, Wen-Chin, Lo, Shao-Hua, Chang, Liang-Chun, Lee, Shang-Fan, Tseng, Yuan-Chieh
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5428722/
https://www.ncbi.nlm.nih.gov/pubmed/28336961
http://dx.doi.org/10.1038/s41598-017-00547-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5428722/
https://www.ncbi.nlm.nih.gov/pubmed/28336961
http://dx.doi.org/10.1038/s41598-017-00547-4

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