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Voltage-induced Interface Reconstruction and Electrical Instability of the Ferromagnet-Semiconductor Device
Using x-ray magnetic spectroscopy with in-situ electrical characterizations, we investigated the effects of external voltage on the spin-electronic and transport properties at the interface of a Fe/ZnO device. Layer-, element-, and spin-resolved information of the device was obtained by cross-tuning...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5428722/ https://www.ncbi.nlm.nih.gov/pubmed/28336961 http://dx.doi.org/10.1038/s41598-017-00547-4 |