Computer vision distortion correction of scanning probe microscopy images

Since its inception, scanning probe microscopy (SPM) has established itself as the tool of choice for probing surfaces and functionalities at the nanoscale. Although recent developments in the instrumentation have greatly improved the metrological aspects of SPM, it is still plagued by the drifts an...

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Detalles Bibliográficos
Autores principales: Gaponenko, Iaroslav, Tückmantel, Philippe, Ziegler, Benedikt, Rapin, Guillaume, Chhikara, Manisha, Paruch, Patrycja
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5429659/
https://www.ncbi.nlm.nih.gov/pubmed/28386115
http://dx.doi.org/10.1038/s41598-017-00765-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5429659/
https://www.ncbi.nlm.nih.gov/pubmed/28386115
http://dx.doi.org/10.1038/s41598-017-00765-w

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