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Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment
Large-area holographic gratings are of great importance in diverse fields including long-range interference metrology, high-resolution astronomical telescopes, and chirped-pulse-amplification systems. However, in conventional interference lithography, the recording length is limited by the aperture...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5430446/ https://www.ncbi.nlm.nih.gov/pubmed/28424475 http://dx.doi.org/10.1038/s41598-017-01099-3 |
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author | Ma, Donghan Zhao, Yuxuan Zeng, Lijiang |
author_facet | Ma, Donghan Zhao, Yuxuan Zeng, Lijiang |
author_sort | Ma, Donghan |
collection | PubMed |
description | Large-area holographic gratings are of great importance in diverse fields including long-range interference metrology, high-resolution astronomical telescopes, and chirped-pulse-amplification systems. However, in conventional interference lithography, the recording length is limited by the aperture of the collimating lenses. Here we propose broad-beam scanning exposure which employs the latent grating generated continuously during scanning for real-time dynamic fringe locking and thus achieves unlimited recording length. This method is experimentally proved to make high-quality gratings, and is expected to be a new type of interference lithography. |
format | Online Article Text |
id | pubmed-5430446 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-54304462017-05-15 Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment Ma, Donghan Zhao, Yuxuan Zeng, Lijiang Sci Rep Article Large-area holographic gratings are of great importance in diverse fields including long-range interference metrology, high-resolution astronomical telescopes, and chirped-pulse-amplification systems. However, in conventional interference lithography, the recording length is limited by the aperture of the collimating lenses. Here we propose broad-beam scanning exposure which employs the latent grating generated continuously during scanning for real-time dynamic fringe locking and thus achieves unlimited recording length. This method is experimentally proved to make high-quality gratings, and is expected to be a new type of interference lithography. Nature Publishing Group UK 2017-04-19 /pmc/articles/PMC5430446/ /pubmed/28424475 http://dx.doi.org/10.1038/s41598-017-01099-3 Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Ma, Donghan Zhao, Yuxuan Zeng, Lijiang Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment |
title | Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment |
title_full | Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment |
title_fullStr | Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment |
title_full_unstemmed | Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment |
title_short | Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment |
title_sort | achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5430446/ https://www.ncbi.nlm.nih.gov/pubmed/28424475 http://dx.doi.org/10.1038/s41598-017-01099-3 |
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