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Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment

Large-area holographic gratings are of great importance in diverse fields including long-range interference metrology, high-resolution astronomical telescopes, and chirped-pulse-amplification systems. However, in conventional interference lithography, the recording length is limited by the aperture...

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Detalles Bibliográficos
Autores principales: Ma, Donghan, Zhao, Yuxuan, Zeng, Lijiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5430446/
https://www.ncbi.nlm.nih.gov/pubmed/28424475
http://dx.doi.org/10.1038/s41598-017-01099-3
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author Ma, Donghan
Zhao, Yuxuan
Zeng, Lijiang
author_facet Ma, Donghan
Zhao, Yuxuan
Zeng, Lijiang
author_sort Ma, Donghan
collection PubMed
description Large-area holographic gratings are of great importance in diverse fields including long-range interference metrology, high-resolution astronomical telescopes, and chirped-pulse-amplification systems. However, in conventional interference lithography, the recording length is limited by the aperture of the collimating lenses. Here we propose broad-beam scanning exposure which employs the latent grating generated continuously during scanning for real-time dynamic fringe locking and thus achieves unlimited recording length. This method is experimentally proved to make high-quality gratings, and is expected to be a new type of interference lithography.
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spelling pubmed-54304462017-05-15 Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment Ma, Donghan Zhao, Yuxuan Zeng, Lijiang Sci Rep Article Large-area holographic gratings are of great importance in diverse fields including long-range interference metrology, high-resolution astronomical telescopes, and chirped-pulse-amplification systems. However, in conventional interference lithography, the recording length is limited by the aperture of the collimating lenses. Here we propose broad-beam scanning exposure which employs the latent grating generated continuously during scanning for real-time dynamic fringe locking and thus achieves unlimited recording length. This method is experimentally proved to make high-quality gratings, and is expected to be a new type of interference lithography. Nature Publishing Group UK 2017-04-19 /pmc/articles/PMC5430446/ /pubmed/28424475 http://dx.doi.org/10.1038/s41598-017-01099-3 Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Ma, Donghan
Zhao, Yuxuan
Zeng, Lijiang
Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment
title Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment
title_full Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment
title_fullStr Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment
title_full_unstemmed Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment
title_short Achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment
title_sort achieving unlimited recording length in interference lithography via broad-beam scanning exposure with self-referencing alignment
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5430446/
https://www.ncbi.nlm.nih.gov/pubmed/28424475
http://dx.doi.org/10.1038/s41598-017-01099-3
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