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Nanometre-scale 3D defects in Cr(2)AlC thin films
MAX-phase Cr(2)AlC containing thin films were synthesized by magnetron sputtering in an industrial system. Nanometre-scale 3D defects are observed near the boundary between regions of Cr(2)AlC and of the disordered solid solution (CrAl)(x)C(y). Shrinkage of the Cr-Cr interplanar distance and elongat...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5430507/ https://www.ncbi.nlm.nih.gov/pubmed/28428564 http://dx.doi.org/10.1038/s41598-017-01196-3 |