Recovery of Alumina Nanocapacitors after High Voltage Breakdown

Breakdown of a dielectric material at high electric fields significantly limits the applicability of metal-dielectric-metal capacitors for energy storage applications. Here we demonstrate that the insulating properties of atomic-layer-deposited Al(2)O(3) thin films in Al/Al(2)O(3)/Al trilayers can r...

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Detalles Bibliográficos
Autores principales: Belkin, A., Bezryadin, A., Hendren, L., Hubler, A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5430567/
https://www.ncbi.nlm.nih.gov/pubmed/28428625
http://dx.doi.org/10.1038/s41598-017-01007-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5430567/
https://www.ncbi.nlm.nih.gov/pubmed/28428625
http://dx.doi.org/10.1038/s41598-017-01007-9

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