Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals

We measure the laser-induced damage threshold (LIDT) fluence under single shot at the surface of Sapphire samples prepared following the standards of two methods yielding to different surface finish and used in optical and laser industry. We use AFM microscopy to measure the roughness parameter Ra a...

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Detalles Bibliográficos
Autores principales: Bussière, Benoît, Sanner, Nicolas, Sentis, Marc, Utéza, Olivier
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5430787/
https://www.ncbi.nlm.nih.gov/pubmed/28455507
http://dx.doi.org/10.1038/s41598-017-01192-7

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5430787/
https://www.ncbi.nlm.nih.gov/pubmed/28455507
http://dx.doi.org/10.1038/s41598-017-01192-7

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