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Quantitative Analysis of Electron Beam Damage in Organic Thin Films
[Image: see text] In transmission electron microscopy (TEM) the interaction of an electron beam with polymers such as P3HT:PCBM photovoltaic nanocomposites results in electron beam damage, which is the most important factor limiting acquisition of structural or chemical data at high spatial resoluti...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical
Society
2017
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5442601/ https://www.ncbi.nlm.nih.gov/pubmed/28553431 http://dx.doi.org/10.1021/acs.jpcc.7b01749 |