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Quantitative Analysis of Electron Beam Damage in Organic Thin Films

[Image: see text] In transmission electron microscopy (TEM) the interaction of an electron beam with polymers such as P3HT:PCBM photovoltaic nanocomposites results in electron beam damage, which is the most important factor limiting acquisition of structural or chemical data at high spatial resoluti...

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Detalles Bibliográficos
Autores principales:	Leijten, Zino J. W. A., Keizer, Arthur D. A., de With, Gijsbertus, Friedrich, Heiner
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	American Chemical Society 2017
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5442601/ https://www.ncbi.nlm.nih.gov/pubmed/28553431 http://dx.doi.org/10.1021/acs.jpcc.7b01749

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