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Improving the Resolution of Kendrick Mass Defect Analysis for Polymer Ions with Fractional Base Units
The concept of a fractional base unit for the Kendrick mass defect (KMD) analysis of polymer ions is introduced for the first time. A fraction of the ethylene oxide (EO) repeat unit (namely EO/8) has been used for the KMD analysis of a poly(ethylene oxide) and found to amplify the variations of KMD...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
The Mass Spectrometry Society of Japan
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5447562/ https://www.ncbi.nlm.nih.gov/pubmed/28580221 http://dx.doi.org/10.5702/massspectrometry.A0055 |