X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La(2)Zr(2)O(7) Buffer Layer Capacity

Lanthanum zirconate (LZO) films from water-based precursors were deposited on Ni-5%W tape by chemical solution deposition. The buffer capacity of these layers includes the prevention of Ni oxidation of the substrate and Ni penetration towards the YBCO film which is detrimental for the superconductin...

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Detalles Bibliográficos
Autores principales: Narayanan, Vyshnavi, de Buysser, Klaartje, Bruneel, Els, van Driessche, Isabel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2012
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5448917/
https://www.ncbi.nlm.nih.gov/pubmed/28817051
http://dx.doi.org/10.3390/ma5030364

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5448917/
https://www.ncbi.nlm.nih.gov/pubmed/28817051
http://dx.doi.org/10.3390/ma5030364

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