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X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La(2)Zr(2)O(7) Buffer Layer Capacity
Lanthanum zirconate (LZO) films from water-based precursors were deposited on Ni-5%W tape by chemical solution deposition. The buffer capacity of these layers includes the prevention of Ni oxidation of the substrate and Ni penetration towards the YBCO film which is detrimental for the superconductin...
Autores principales: | Narayanan, Vyshnavi, de Buysser, Klaartje, Bruneel, Els, van Driessche, Isabel |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2012
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5448917/ https://www.ncbi.nlm.nih.gov/pubmed/28817051 http://dx.doi.org/10.3390/ma5030364 |
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