Cargando…
A Study of Trimethylsilane (3MS) and Tetramethylsilane (4MS) Based α-SiCN:H/α-SiCO:H Diffusion Barrier Films
Amorphous nitrogen-doped silicon carbide (α-SiCN:H) films have been used as a Cu penetration diffusion barrier and interconnect etch stop layer in the below 90-nanometer ultra-large scale integration (ULSI) manufacturing technology. In this study, the etching stop layers were deposited by using trim...
Autores principales: | Chen, Sheng-Wen, Wang, Yu-Sheng, Hu, Shao-Yu, Lee, Wen-Hsi, Chi, Chieh-Cheng, Wang, Ying-Lang |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2012
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5448926/ https://www.ncbi.nlm.nih.gov/pubmed/28817052 http://dx.doi.org/10.3390/ma5030377 |
Ejemplares similares
-
Synthesis, Characterization and Reactions of (Azidoethynyl)trimethylsilane
por: Banert, Klaus, et al.
Publicado: (2015) -
(3,5-Dimethyl-1H-pyrazol-1-yl)trimethylsilane
por: Böhme, Uwe, et al.
Publicado: (2020) -
Effects of $\gamma$-irradiation on the electron lifetime and positive ion mobility in tetramethylsilane and tetramethylpentane
por: Givernaud, Alain, et al.
Publicado: (1991) -
Deoxygenative gem-difluoroolefination of carbonyl compounds with (chlorodifluoromethyl)trimethylsilane and triphenylphosphine
por: Wang, Fei, et al.
Publicado: (2014) -
Meso-Structuring of SiCN Ceramics by Polystyrene Templates
por: Ewert, Julia-Katharina, et al.
Publicado: (2015)