Characterization of Natural Dyes and Traditional Korean Silk Fabric by Surface Analytical Techniques

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS) are well established surface techniques that provide both elemental and organic information from several monolayers of a sample surface, while also allowing depth profiling or image mapping to be car...

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Detalles Bibliográficos
Autores principales: Lee, Jihye, Kang, Min Hwa, Lee, Kang-Bong, Lee, Yeonhee
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5452504/
https://www.ncbi.nlm.nih.gov/pubmed/28809257
http://dx.doi.org/10.3390/ma6052007

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5452504/
https://www.ncbi.nlm.nih.gov/pubmed/28809257
http://dx.doi.org/10.3390/ma6052007

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