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Characterization of Natural Dyes and Traditional Korean Silk Fabric by Surface Analytical Techniques
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS) are well established surface techniques that provide both elemental and organic information from several monolayers of a sample surface, while also allowing depth profiling or image mapping to be car...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5452504/ https://www.ncbi.nlm.nih.gov/pubmed/28809257 http://dx.doi.org/10.3390/ma6052007 |