Soft X-ray Exposure Promotes Na Intercalation in Graphene Grown on Si-Face SiC

An investigation of how electron/photon beam exposures affect the intercalation rate of Na deposited on graphene prepared on Si-face SiC is presented. Focused radiation from a storage ring is used for soft X-ray exposures while the electron beam in a low energy electron microscope is utilized for el...

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Detalles Bibliográficos
Autores principales: Watcharinyanon, Somsakul, Xia, Chao, Niu, Yuran, Zakharov, Alexei A., Johansson, Leif I., Yakimova, Rositza, Virojanadara, Chariya
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5455511/
https://www.ncbi.nlm.nih.gov/pubmed/28793470
http://dx.doi.org/10.3390/ma8084768

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5455511/
https://www.ncbi.nlm.nih.gov/pubmed/28793470
http://dx.doi.org/10.3390/ma8084768

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