X-Ray Spectroscopy of Ultra-Thin Oxide/Oxide Heteroepitaxial Films: A Case Study of Single-Nanometer VO(2)/TiO(2)

Epitaxial ultra-thin oxide films can support large percent level strains well beyond their bulk counterparts, thereby enabling strain-engineering in oxides that can tailor various phenomena. At these reduced dimensions (typically < 10 nm), contributions from the substrate can dwarf the signal fro...

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Detalles Bibliográficos
Autores principales: Quackenbush, Nicholas F., Paik, Hanjong, Woicik, Joseph C., Arena, Dario A., Schlom, Darrell G., Piper, Louis F. J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5455529/
https://www.ncbi.nlm.nih.gov/pubmed/28793516
http://dx.doi.org/10.3390/ma8085255

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5455529/
https://www.ncbi.nlm.nih.gov/pubmed/28793516
http://dx.doi.org/10.3390/ma8085255

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