Using Noise and Fluctuations for In Situ Measurements of Nitrogen Diffusion Depth

In manufacturing processes involving diffusion (of C, N, S, etc.), the evolution of the layer depth is of the utmost importance: the success of the entire process depends on this parameter. Currently, nitriding is typically either calibrated using a “post process” method or controlled via indirect m...

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Detalles Bibliográficos
Autores principales: Samoila, Cornel, Ursutiu, Doru, Schleer, Walter-Harald, Jinga, Vlad, Nascov, Victor
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456600/
https://www.ncbi.nlm.nih.gov/pubmed/28773941
http://dx.doi.org/10.3390/ma9100819

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456600/
https://www.ncbi.nlm.nih.gov/pubmed/28773941
http://dx.doi.org/10.3390/ma9100819

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