Cargando…
Using Noise and Fluctuations for In Situ Measurements of Nitrogen Diffusion Depth
In manufacturing processes involving diffusion (of C, N, S, etc.), the evolution of the layer depth is of the utmost importance: the success of the entire process depends on this parameter. Currently, nitriding is typically either calibrated using a “post process” method or controlled via indirect m...
| Autores principales: | , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2016
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456600/ https://www.ncbi.nlm.nih.gov/pubmed/28773941 http://dx.doi.org/10.3390/ma9100819 |