A Model of BGA Thermal Fatigue Life Prediction Considering Load Sequence Effects

Accurate testing history data is necessary for all fatigue life prediction approaches, but such data is always deficient especially for the microelectronic devices. Additionally, the sequence of the individual load cycle plays an important role in physical fatigue damage. However, most of the existi...

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Detalles Bibliográficos
Autores principales: Hu, Weiwei, Li, Yaqiu, Sun, Yufeng, Mosleh, Ali
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456602/
https://www.ncbi.nlm.nih.gov/pubmed/28773980
http://dx.doi.org/10.3390/ma9100860

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456602/
https://www.ncbi.nlm.nih.gov/pubmed/28773980
http://dx.doi.org/10.3390/ma9100860

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