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A Model of BGA Thermal Fatigue Life Prediction Considering Load Sequence Effects
Accurate testing history data is necessary for all fatigue life prediction approaches, but such data is always deficient especially for the microelectronic devices. Additionally, the sequence of the individual load cycle plays an important role in physical fatigue damage. However, most of the existi...
Autores principales: | Hu, Weiwei, Li, Yaqiu, Sun, Yufeng, Mosleh, Ali |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5456602/ https://www.ncbi.nlm.nih.gov/pubmed/28773980 http://dx.doi.org/10.3390/ma9100860 |
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