Energy Storage Characteristics of BiFeO(3)/BaTiO(3) Bi-Layers Integrated on Si

BiFeO(3)/BaTiO(3) bi-layer thick films (~1 μm) were deposited on Pt/Ti/SiO(2)/(100) Si substrates with LaNiO(3) buffer layers at 500 °C via a rf magnetron sputtering process. X-ray diffraction (XRD) analysis revealed that both BiFeO(3) and BaTiO(3) layers have a (00l) preferred orientation. The film...

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Detalles Bibliográficos
Autores principales: Liu, Menglin, Zhu, Hanfei, Zhang, Yunxiang, Xue, Caihong, Ouyang, Jun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5457274/
https://www.ncbi.nlm.nih.gov/pubmed/28774055
http://dx.doi.org/10.3390/ma9110935

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5457274/
https://www.ncbi.nlm.nih.gov/pubmed/28774055
http://dx.doi.org/10.3390/ma9110935

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