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Energy Storage Characteristics of BiFeO(3)/BaTiO(3) Bi-Layers Integrated on Si

BiFeO(3)/BaTiO(3) bi-layer thick films (~1 μm) were deposited on Pt/Ti/SiO(2)/(100) Si substrates with LaNiO(3) buffer layers at 500 °C via a rf magnetron sputtering process. X-ray diffraction (XRD) analysis revealed that both BiFeO(3) and BaTiO(3) layers have a (00l) preferred orientation. The film...

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Detalles Bibliográficos
Autores principales:	Liu, Menglin, Zhu, Hanfei, Zhang, Yunxiang, Xue, Caihong, Ouyang, Jun
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2016
Materias:	Communication
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5457274/ https://www.ncbi.nlm.nih.gov/pubmed/28774055 http://dx.doi.org/10.3390/ma9110935

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