Virtual substrate method for nanomaterials characterization

Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials, but generally non-quantitatively. This is because the nanomaterial signals are inevitably buried in the signals from the underlying substrate in common reflectio...

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Detalles Bibliográficos
Autores principales: Da, Bo, Liu, Jiangwei, Yamamoto, Mahito, Ueda, Yoshihiro, Watanabe, Kazuyuki, Cuong, Nguyen Thanh, Li, Songlin, Tsukagoshi, Kazuhito, Yoshikawa, Hideki, Iwai, Hideo, Tanuma, Shigeo, Guo, Hongxuan, Gao, Zhaoshun, Sun, Xia, Ding, Zejun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458549/
https://www.ncbi.nlm.nih.gov/pubmed/28548114
http://dx.doi.org/10.1038/ncomms15629

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458549/
https://www.ncbi.nlm.nih.gov/pubmed/28548114
http://dx.doi.org/10.1038/ncomms15629

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