Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging

Coherent X-ray diffraction imaging at symmetric hhh Bragg reflections was used to resolve the structure of GaAs/In(0.15)Ga(0.85)As/GaAs core–shell–shell nanowires grown on a silicon (111) substrate. Diffraction amplitudes in the vicinity of GaAs 111 and GaAs 333 reflections were used to reconstruct...

Descripción completa

Detalles Bibliográficos
Autores principales: Davtyan, Arman, Krause, Thilo, Kriegner, Dominik, Al-Hassan, Ali, Bahrami, Danial, Mostafavi Kashani, Seyed Mohammad, Lewis, Ryan B., Küpers, Hanno, Tahraoui, Abbes, Geelhaar, Lutz, Hanke, Michael, Leake, Steven John, Loffeld, Otmar, Pietsch, Ullrich
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458586/
https://www.ncbi.nlm.nih.gov/pubmed/28656032
http://dx.doi.org/10.1107/S1600576717004149

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458586/
https://www.ncbi.nlm.nih.gov/pubmed/28656032
http://dx.doi.org/10.1107/S1600576717004149

Ejemplares similares