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Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction

This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The Al(x)In(1−x)Sb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental copl...

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Detalles Bibliográficos
Autores principales: Borcha, Mariana, Fodchuk, Igor, Solodkyi, Mykola, Baidakova, Marina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458591/
https://www.ncbi.nlm.nih.gov/pubmed/28656037
http://dx.doi.org/10.1107/S1600576717006574