Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction

This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The Al(x)In(1−x)Sb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental copl...

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Autores principales: Borcha, Mariana, Fodchuk, Igor, Solodkyi, Mykola, Baidakova, Marina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2017
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458591/
https://www.ncbi.nlm.nih.gov/pubmed/28656037
http://dx.doi.org/10.1107/S1600576717006574
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author Borcha, Mariana
Fodchuk, Igor
Solodkyi, Mykola
Baidakova, Marina
author_facet Borcha, Mariana
Fodchuk, Igor
Solodkyi, Mykola
Baidakova, Marina
author_sort Borcha, Mariana
collection PubMed
description This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The Al(x)In(1−x)Sb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental coplanar three-beam or coincidental noncoplanar four-beam X-ray diffraction. These conditions provide the means for a high-precision determination of lattice parameters and strain anisotropy in layers.
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spelling pubmed-54585912017-06-27 Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction Borcha, Mariana Fodchuk, Igor Solodkyi, Mykola Baidakova, Marina J Appl Crystallogr Research Papers This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The Al(x)In(1−x)Sb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental coplanar three-beam or coincidental noncoplanar four-beam X-ray diffraction. These conditions provide the means for a high-precision determination of lattice parameters and strain anisotropy in layers. International Union of Crystallography 2017-05-25 /pmc/articles/PMC5458591/ /pubmed/28656037 http://dx.doi.org/10.1107/S1600576717006574 Text en © Mariana Borcha et al. 2017 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.http://creativecommons.org/licenses/by/2.0/uk/
spellingShingle Research Papers
Borcha, Mariana
Fodchuk, Igor
Solodkyi, Mykola
Baidakova, Marina
Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction
title Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction
title_full Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction
title_fullStr Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction
title_full_unstemmed Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction
title_short Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction
title_sort structure diagnostics of heterostructures and multi-layered systems by x-ray multiple diffraction
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458591/
https://www.ncbi.nlm.nih.gov/pubmed/28656037
http://dx.doi.org/10.1107/S1600576717006574
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