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Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction
This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The Al(x)In(1−x)Sb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental copl...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5458591/ https://www.ncbi.nlm.nih.gov/pubmed/28656037 http://dx.doi.org/10.1107/S1600576717006574 |