The electromigration effect revisited: non-uniform local tensile stress-driven diffusion

The electromigration (EM) effect involves atomic diffusion of metals under current stressing. Recent theories of EM are based on the unbalanced electrostatic and electron-wind forces exerted on metal ions. However, none of these models have coupled the EM effect and lattice stability. Here, we perfo...

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Detalles Bibliográficos
Autores principales: Lin, Shih-kang, Liu, Yu-chen, Chiu, Shang-Jui, Liu, Yen-Ting, Lee, Hsin-Yi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5465215/
https://www.ncbi.nlm.nih.gov/pubmed/28596543
http://dx.doi.org/10.1038/s41598-017-03324-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5465215/
https://www.ncbi.nlm.nih.gov/pubmed/28596543
http://dx.doi.org/10.1038/s41598-017-03324-5

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