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The electromigration effect revisited: non-uniform local tensile stress-driven diffusion
The electromigration (EM) effect involves atomic diffusion of metals under current stressing. Recent theories of EM are based on the unbalanced electrostatic and electron-wind forces exerted on metal ions. However, none of these models have coupled the EM effect and lattice stability. Here, we perfo...
Autores principales: | Lin, Shih-kang, Liu, Yu-chen, Chiu, Shang-Jui, Liu, Yen-Ting, Lee, Hsin-Yi |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5465215/ https://www.ncbi.nlm.nih.gov/pubmed/28596543 http://dx.doi.org/10.1038/s41598-017-03324-5 |
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