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A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process
This paper reports a novel full logic compatible 4T2R non-volatile static random access memory (nv-SRAM) featuring its self-inhibit data storing mechanism for in low-power/high-speed SRAM application. With compact cell area and full logic compatibility, this new nv-SRAM incorporates two STI-ReRAMs e...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5472634/ https://www.ncbi.nlm.nih.gov/pubmed/28622720 http://dx.doi.org/10.1186/s11671-017-2191-9 |
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author | Hsu, Meng-Yin Liao, Chu-Feng Shih, Yi-Hong Lin, Chrong Jung King, Ya-Chin |
author_facet | Hsu, Meng-Yin Liao, Chu-Feng Shih, Yi-Hong Lin, Chrong Jung King, Ya-Chin |
author_sort | Hsu, Meng-Yin |
collection | PubMed |
description | This paper reports a novel full logic compatible 4T2R non-volatile static random access memory (nv-SRAM) featuring its self-inhibit data storing mechanism for in low-power/high-speed SRAM application. With compact cell area and full logic compatibility, this new nv-SRAM incorporates two STI-ReRAMs embedded inside the 4T SRAM. Data can be read/write through a cross-couple volatile structure for maintaining fast accessing speed. Data can be non-volatilely stored in new SRAM cell through a unique self-inhibit operation onto the resistive random access memory (RRAM) load, achieving zero static power during data hold. |
format | Online Article Text |
id | pubmed-5472634 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | Springer US |
record_format | MEDLINE/PubMed |
spelling | pubmed-54726342017-06-28 A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process Hsu, Meng-Yin Liao, Chu-Feng Shih, Yi-Hong Lin, Chrong Jung King, Ya-Chin Nanoscale Res Lett Nano Express This paper reports a novel full logic compatible 4T2R non-volatile static random access memory (nv-SRAM) featuring its self-inhibit data storing mechanism for in low-power/high-speed SRAM application. With compact cell area and full logic compatibility, this new nv-SRAM incorporates two STI-ReRAMs embedded inside the 4T SRAM. Data can be read/write through a cross-couple volatile structure for maintaining fast accessing speed. Data can be non-volatilely stored in new SRAM cell through a unique self-inhibit operation onto the resistive random access memory (RRAM) load, achieving zero static power during data hold. Springer US 2017-06-15 /pmc/articles/PMC5472634/ /pubmed/28622720 http://dx.doi.org/10.1186/s11671-017-2191-9 Text en © The Author(s). 2017 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. |
spellingShingle | Nano Express Hsu, Meng-Yin Liao, Chu-Feng Shih, Yi-Hong Lin, Chrong Jung King, Ya-Chin A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process |
title | A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process |
title_full | A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process |
title_fullStr | A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process |
title_full_unstemmed | A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process |
title_short | A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process |
title_sort | rram integrated 4t sram with self-inhibit resistive switching load by pure cmos logic process |
topic | Nano Express |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5472634/ https://www.ncbi.nlm.nih.gov/pubmed/28622720 http://dx.doi.org/10.1186/s11671-017-2191-9 |
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