Enhanced FIB-SEM systems for large-volume 3D imaging

Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) can automatically generate 3D images with superior z-axis resolution, yielding data that needs minimal image registration and related post-processing. Obstacles blocking wider adoption of FIB-SEM include slow imaging speed and lack of long-term...

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Detalles Bibliográficos
Autores principales: Xu, C Shan, Hayworth, Kenneth J, Lu, Zhiyuan, Grob, Patricia, Hassan, Ahmed M, García-Cerdán, José G, Niyogi, Krishna K, Nogales, Eva, Weinberg, Richard J, Hess, Harald F
Formato: Online Artículo Texto
Lenguaje:English
Publicado: eLife Sciences Publications, Ltd 2017
Materias:
Cell Biology
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5476429/
https://www.ncbi.nlm.nih.gov/pubmed/28500755
http://dx.doi.org/10.7554/eLife.25916

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5476429/
https://www.ncbi.nlm.nih.gov/pubmed/28500755
http://dx.doi.org/10.7554/eLife.25916

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