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The relation between residual stress, interfacial structure and the joint property in the SiO(2f)/SiO(2)-Nb joints
In order to achieve a high-quality joint between SiO(2f)/SiO(2) and metals, it is necessary to address the poor wettability of SiO(2f)/SiO(2) and the high residual stress in SiO(2f)/SiO(2)-Nb joint. Here, we simultaneously realize good wettability and low residual stress in SiO(2f)/SiO(2)-Nb joint b...
Autores principales: | , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5482827/ https://www.ncbi.nlm.nih.gov/pubmed/28646185 http://dx.doi.org/10.1038/s41598-017-04531-w |
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author | Ma, Qiang Li, Zhuo Ran Yang, Lai Shan Lin, Jing Huang Ba, Jin Wang, Ze Yu Qi, Jun Lei Feng, Ji Cai |
author_facet | Ma, Qiang Li, Zhuo Ran Yang, Lai Shan Lin, Jing Huang Ba, Jin Wang, Ze Yu Qi, Jun Lei Feng, Ji Cai |
author_sort | Ma, Qiang |
collection | PubMed |
description | In order to achieve a high-quality joint between SiO(2f)/SiO(2) and metals, it is necessary to address the poor wettability of SiO(2f)/SiO(2) and the high residual stress in SiO(2f)/SiO(2)-Nb joint. Here, we simultaneously realize good wettability and low residual stress in SiO(2f)/SiO(2)-Nb joint by combined method of HF etching treatment and Finite Element Analysis (FEA). After etching treatment, the wettability of E-SiO(2f)/SiO(2) was improved, and the residual stress in the joint was decreased. In order to better control the quality of joints, efforts were made to understand the relationship between surface structure of E-SiO(2f)/SiO(2) and residual stress in joint using FEA. Based on the direction of FEA results, a relationship between residual stress, surface structure and joint property in the brazed joints were investigated by experiments. As well the FEA and the brazing test results both realized the high-quality joint of E-SiO(2f)/SiO(2)-Nb and the shear strength of the joint reached 61.9 MPa. |
format | Online Article Text |
id | pubmed-5482827 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-54828272017-06-26 The relation between residual stress, interfacial structure and the joint property in the SiO(2f)/SiO(2)-Nb joints Ma, Qiang Li, Zhuo Ran Yang, Lai Shan Lin, Jing Huang Ba, Jin Wang, Ze Yu Qi, Jun Lei Feng, Ji Cai Sci Rep Article In order to achieve a high-quality joint between SiO(2f)/SiO(2) and metals, it is necessary to address the poor wettability of SiO(2f)/SiO(2) and the high residual stress in SiO(2f)/SiO(2)-Nb joint. Here, we simultaneously realize good wettability and low residual stress in SiO(2f)/SiO(2)-Nb joint by combined method of HF etching treatment and Finite Element Analysis (FEA). After etching treatment, the wettability of E-SiO(2f)/SiO(2) was improved, and the residual stress in the joint was decreased. In order to better control the quality of joints, efforts were made to understand the relationship between surface structure of E-SiO(2f)/SiO(2) and residual stress in joint using FEA. Based on the direction of FEA results, a relationship between residual stress, surface structure and joint property in the brazed joints were investigated by experiments. As well the FEA and the brazing test results both realized the high-quality joint of E-SiO(2f)/SiO(2)-Nb and the shear strength of the joint reached 61.9 MPa. Nature Publishing Group UK 2017-06-23 /pmc/articles/PMC5482827/ /pubmed/28646185 http://dx.doi.org/10.1038/s41598-017-04531-w Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Ma, Qiang Li, Zhuo Ran Yang, Lai Shan Lin, Jing Huang Ba, Jin Wang, Ze Yu Qi, Jun Lei Feng, Ji Cai The relation between residual stress, interfacial structure and the joint property in the SiO(2f)/SiO(2)-Nb joints |
title | The relation between residual stress, interfacial structure and the joint property in the SiO(2f)/SiO(2)-Nb joints |
title_full | The relation between residual stress, interfacial structure and the joint property in the SiO(2f)/SiO(2)-Nb joints |
title_fullStr | The relation between residual stress, interfacial structure and the joint property in the SiO(2f)/SiO(2)-Nb joints |
title_full_unstemmed | The relation between residual stress, interfacial structure and the joint property in the SiO(2f)/SiO(2)-Nb joints |
title_short | The relation between residual stress, interfacial structure and the joint property in the SiO(2f)/SiO(2)-Nb joints |
title_sort | relation between residual stress, interfacial structure and the joint property in the sio(2f)/sio(2)-nb joints |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5482827/ https://www.ncbi.nlm.nih.gov/pubmed/28646185 http://dx.doi.org/10.1038/s41598-017-04531-w |
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