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The Effect of Leaf Stacking on Leaf Reflectance and Vegetation Indices Measured by Contact Probe during the Season
The aims of the study were: (i) to compare leaf reflectance in visible (VIS) (400–700 nm), near-infrared (NIR) (740–1140 nm) and short-wave infrared (SWIR) (2000–2400 nm) spectral ranges measured monthly by a contact probe on a single leaf and a stack of five leaves (measurement setup (MS)) of two b...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5492110/ https://www.ncbi.nlm.nih.gov/pubmed/28538685 http://dx.doi.org/10.3390/s17061202 |