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Study of a Compression-Molding Process for Ultraviolet Light-Emitting Diode Exposure Systems via Finite-Element Analysis

Although wafer-level camera lenses are a very promising technology, problems such as warpage with time and non-uniform thickness of products still exist. In this study, finite element simulation was performed to simulate the compression molding process for acquiring the pressure distribution on the...

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Detalles Bibliográficos
Autores principales: Wu, Kuo-Tsai, Hwang, Sheng-Jye, Lee, Huei-Huang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5492456/
https://www.ncbi.nlm.nih.gov/pubmed/28617315
http://dx.doi.org/10.3390/s17061392
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author Wu, Kuo-Tsai
Hwang, Sheng-Jye
Lee, Huei-Huang
author_facet Wu, Kuo-Tsai
Hwang, Sheng-Jye
Lee, Huei-Huang
author_sort Wu, Kuo-Tsai
collection PubMed
description Although wafer-level camera lenses are a very promising technology, problems such as warpage with time and non-uniform thickness of products still exist. In this study, finite element simulation was performed to simulate the compression molding process for acquiring the pressure distribution on the product on completion of the process and predicting the deformation with respect to the pressure distribution. Results show that the single-gate compression molding process significantly increases the pressure at the center of the product, whereas the multi-gate compressing molding process can effectively distribute the pressure. This study evaluated the non-uniform thickness of product and changes in the process parameters through computer simulations, which could help to improve the compression molding process.
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spelling pubmed-54924562017-07-03 Study of a Compression-Molding Process for Ultraviolet Light-Emitting Diode Exposure Systems via Finite-Element Analysis Wu, Kuo-Tsai Hwang, Sheng-Jye Lee, Huei-Huang Sensors (Basel) Article Although wafer-level camera lenses are a very promising technology, problems such as warpage with time and non-uniform thickness of products still exist. In this study, finite element simulation was performed to simulate the compression molding process for acquiring the pressure distribution on the product on completion of the process and predicting the deformation with respect to the pressure distribution. Results show that the single-gate compression molding process significantly increases the pressure at the center of the product, whereas the multi-gate compressing molding process can effectively distribute the pressure. This study evaluated the non-uniform thickness of product and changes in the process parameters through computer simulations, which could help to improve the compression molding process. MDPI 2017-06-15 /pmc/articles/PMC5492456/ /pubmed/28617315 http://dx.doi.org/10.3390/s17061392 Text en © 2017 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Wu, Kuo-Tsai
Hwang, Sheng-Jye
Lee, Huei-Huang
Study of a Compression-Molding Process for Ultraviolet Light-Emitting Diode Exposure Systems via Finite-Element Analysis
title Study of a Compression-Molding Process for Ultraviolet Light-Emitting Diode Exposure Systems via Finite-Element Analysis
title_full Study of a Compression-Molding Process for Ultraviolet Light-Emitting Diode Exposure Systems via Finite-Element Analysis
title_fullStr Study of a Compression-Molding Process for Ultraviolet Light-Emitting Diode Exposure Systems via Finite-Element Analysis
title_full_unstemmed Study of a Compression-Molding Process for Ultraviolet Light-Emitting Diode Exposure Systems via Finite-Element Analysis
title_short Study of a Compression-Molding Process for Ultraviolet Light-Emitting Diode Exposure Systems via Finite-Element Analysis
title_sort study of a compression-molding process for ultraviolet light-emitting diode exposure systems via finite-element analysis
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5492456/
https://www.ncbi.nlm.nih.gov/pubmed/28617315
http://dx.doi.org/10.3390/s17061392
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