Thermoelectric La-doped SrTiO(3) epitaxial layers with single-crystal quality: from nano to micrometers

High-quality thermoelectric La(0.2)Sr(0.8)TiO(3) (LSTO) films, with thicknesses ranging from 20 nm to 0.7 μm, have been epitaxially grown on SrTiO(3)(001) substrates by enhanced solid-source oxide molecular-beam epitaxy. All films are atomically flat (with rms roughness < 0.2 nm), with low mosaic...

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Detalles Bibliográficos
Autores principales: Apreutesei, Mihai, Debord, Régis, Bouras, Mohamed, Regreny, Philippe, Botella, Claude, Benamrouche, Aziz, Carretero-Genevrier, Adrian, Gazquez, Jaume, Grenet, Geneviève, Pailhès, Stéphane, Saint-Girons, Guillaume, Bachelet, Romain
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2017
Materias:
Energy Materials
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5507149/
https://www.ncbi.nlm.nih.gov/pubmed/28740558
http://dx.doi.org/10.1080/14686996.2017.1336055

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5507149/
https://www.ncbi.nlm.nih.gov/pubmed/28740558
http://dx.doi.org/10.1080/14686996.2017.1336055

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