Doping-induced carrier profiles in organic semiconductors determined from capacitive extraction-current transients

A method to determine the doping induced charge carrier profiles in lightly and moderately doped organic semiconductor thin films is presented. The theory of the method of Charge Extraction by a Linearly Increasing Voltage technique in the doping-induced capacitive regime (doping-CELIV) is extended...

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Detalles Bibliográficos
Autores principales: Nyman, Mathias, Sandberg, Oskar J., Dahlström, Staffan, Spoltore, Donato, Körner, Christian, Zhang, Yadong, Barlow, Stephen, Marder, Seth R., Leo, Karl, Vandewal, Koen, Österbacka, Ronald
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5511276/
https://www.ncbi.nlm.nih.gov/pubmed/28710352
http://dx.doi.org/10.1038/s41598-017-05499-3

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5511276/
https://www.ncbi.nlm.nih.gov/pubmed/28710352
http://dx.doi.org/10.1038/s41598-017-05499-3

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