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Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu(2)O Thin Films
A quantitative and analytical investigation on the conduction mechanism in p-type cuprous oxide (Cu(2)O) thin films is performed based on analysis of the relative dominance of trap-limited and grain-boundary-limited conduction. It is found that carrier transport in as-deposited Cu(2)O is governed by...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2017
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5515854/ https://www.ncbi.nlm.nih.gov/pubmed/28720754 http://dx.doi.org/10.1038/s41598-017-05893-x |